Simulation Services
Getting it right the first time is paramount in today’s fast-paced, cost-sensitive semiconductor test industry. ECT offers Simulation Services to predict, optimize, and troubleshoot the electrical performance of your test interface, providing invaluable insight into the complex ATE environment. With an ECT simulation, you can accurately estimate interface performance prior to fabrication and ensure a successful transformation from concept to production.
Contactor Characterization/Simulation
ECT has created 3D models of all standard contactor technologies. These models have been correlated to physical measurements in the lab using a 40GHz VNA.

Custom contactor simulation includes 3 main areas of focus:
• Launch Optimization – The launch (PCB to Contactor transition) creates an impedance discontinuity which effects performance. Simulation can minimize this effect by modifying the structures around the transition, such as the via diameter and via clearance diameter.
• Impedance Optimization – The signal integrity of a contactor is dictated by the contactor’s impedance. Impedance is a function of several parameters, including probe diameter, contactor dielectric material, and probe pitch. Simulation can determine device-specific impedance and provide a solution that best matches the impedance of the contactor to the impedance of the device and PCB.
• Ground Probe Optimization – The locations of the ground probes impacts the inductance through the contactor. In a peripherally-leaded device (QFN, MLF, QFP,etc), it is possible to optimize these locations to improve performance through simulation.