ECT Patents Issued
1996
Electrical Connectors, October 2, 1996 - #2,291,544
Vacuum Test Fixture for Printed Circuit Boards, September 17, 1996 - #5,557,211
Spring-Loaded Electrical Contact Probe, September 17, 1996 - #5,557,213
Test Fixture, August 21, 1996 - #2,267,786
BSL Great Britain Patent, April 24, 1996 - #2,294,365
Retention of Test Probes in Translator Fixtures, February 20, 1996 - #5,493,230

1995
Test Fixture Having Translator for Grid Interface, September 19, 1995 - #5,450,017
Compliant Electrical Connectors, September 5, 1995 - #5,447,442
Test Module Hanger for Test Fixtures, August 22, 1995 - #5,444,387
Marker Probe, May 16, 1995 - #5,416,428
Test Fixture Alignment System for Printed Circuit Boards, April 18, 1995 - #5,408,189
Low Insertion Force Electrical Interface Assembly & Actuable Interface Assembly, March 22, 1995 - #4,377,318
Twisting Electrical Test Probe with Controlled Pointing Accuracy, February 21, 1995 - #5,391,995
Expandable Diaphragm Test Modules and Connectors, February 14, 1995 - #5,389,885

1994
Test Fixture Alignment System, June 14, 1994 - #5,321,351
Test Fixture, April 5, 1994 - #5,300,881
In-Circuit Test Apparatus, April 5, 1994 - #5,300,881
Testing of Integrated Circuit Devices of Loaded Printed Circuit Boards, February 22, 1994 - #5,289,117
Co-Axial Test Probe, February 1, 1994 - #343,802

1993
Dual Side Access Test Fixture, December 14, 1993 - #5,270,641
Pneumatic Test Fixture with Springless Test Probes, October 12, 1993 - #5,252,916
Testing of Integrated Circuit Devices of Loaded Printed Circuit Boards, September 21, 1993 - #5,247,246
Switch Probe, August 3, 1993 - #5,233,290
Dual Level Test Fixture, May 25, 1993 - #5,214,374
Testing of Integrated Circuit Devices of Loaded Printed Boards, January 19, 1993 - #5,180,976

1992
Optical Fiber Test Probe, July 28, 1992 - #5,134,280
Printed Circuit Board Assembly Tester, June 30, 1992 - #5,126,953

1991
Testing of Integrated Circuit Devices of Loaded Printed Boards, September 17, 1991 - #5,049,813
Electrical Test Probe Contact Tip, September 3, 1991 - #5,045,780
Electrical Test Probe Having Rotational Control of the Probe Shaft, July 16, 1991 - #5,032,787
Breakaway Probe Repetitive Switching, January 8, 1991 - #4,938,909

1989
Technique for Elimination of Static in PCB Test Fixtures, March 21, 1989 - #4,814,698

1988
Quick Termination Apparatus and Method for Electrical Connector, January 19, 1988 - #4,720,275

1987
Low/High Voltage Field Effect Trans Switching Circuit for PCB Tester, November 3, 1987 - #4,704,551


1985
Automatic Test Program List Generation Using Programmed Digital Computer, October 29, 1985 - #4,550,406
In-Circuit Test Apparatus for Printed Circuit Boards, August 27, 1985 - #4,538,104

1984
Low Resistance Electrical Spring Probe, July 24, 1984 - #4,461,993

1983
Low Insertion Force Actuable Interface for Electrical Contacts, September 20, 1983 - #4,405,191

1982
Universal Test Fixture Employing Interchangeable Wire Personalizers, September 28, 1982 - #4,352,061
PCB Test Fixture Having Interchangeable Card Personalizers, March 23, 1982 - #4,321,533

1980
Fixturing System, October 28, 1980 - #4,230,985
Interchangeable Test Head for Loaded Test Member, June 24, 1980 - #4,209,745
Straight Through Electrical Spring Probe, April 29, 1980 - #4,200,351

1979
Test Apparatus , February 6, 1979 - #4,138,186


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