IC Device Contact
Probes
Test Center .039 (1.00)
| Probe Specifications | |
| Mechanical | |
| Full Travel: | (Both ends combined) .075 (1.91) |
| Recommended Working Travel: |
(Both ends combined) .050 (1.27) |
| Mechanical Life Exceeds: | 1 x 106 cycles |
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| Operating Temperature | -55°C to +150°C |
| Consult factory for other temperature requirements, and applications below -40° | |
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| Electrical (Static Conditions) | |
| Current Rating: | 2 amps |
| Maximum continuous current, non-inductive at working travel | |
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| Probe Resistance | 80 milliohms |
| With a standard deviation of <4 milliohms @ 25 mA test current | |
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| Materials and Finishes | |
| Plunger: | Beryllium copper, gold plated |
| Barrel: | Nickel silver, gold plated |
| Spring: | Beryllium copper, silver plated |
Spring Force (top)
| Spring Force in 0z. (grams) | |||
| Spring Type | Preload | .050 Travel | |
| Standard | Shown | .52 (15) | 1.50 (43) |
| Optional spring forces and materials are available | |||
How to Order (top)
For each probe, specify the probe model and tip style as shown in the example below. If required, specify the optional non-standard spring force.
Example:
