| Test Center in. (mm) |
Root Part Number |
Application |
| .020 (0.50) |
CSP5
|
Semiconductor Probes |
| .030 (0.762) |
IP20
|
IC Test Probes |
| .030 (0,80) |
CSP8
|
Semiconductor Probes |
| .039 (1.00) |
IP27
|
IC Test Probes |
| .050 (1.27) |
DER-50
|
Double-Ended Receptacles |
|
POGO®-72
|
Loaded PCB Test Probes |
|
DER28-IP261
|
Test System Interface Probes
|
|
IP261
|
Loaded PCB Test Probes
May be suited to: Bare PCB Test Applications and IC Test Applications |
|
IP271
|
Loaded PCB Test Probes
May be suited to: Bare PCB Test Applications and IC Test Applications
|
|
P2662A
|
Loaded PCB Test Probes
May be suited to: IC Test Applications |
|
P2662B
|
Loaded PCB Test Probes
May be suited to: IC Test Applications
|
| .075 (1.91) |
DER-75
|
Double-Ended Receptacles
|
|
POGO®-1
|
Loaded PCB Test Probes |
|
DRP27P55
|
IC Test Probes |
|
P2663
|
Loaded PCB Test Probes
May be suited to: Bare PCB Test Applications |
|
IP40
|
General Purpose Probes
|
| .100 (2.54) |
DER-100
|
Double-Ended Receptacles |
|
FRP-25T
|
Test System Interface Probes |
|
GSP-2B
|
Test System Interface Probes |
|
SIP-90
|
Test System Interface Probes |
|
GPP-95-2
|
Test System Interface Probes |
|
POGO®-25
|
Loaded PCB Test Probes |
|
BGP52L30-DE-LV
|
IC Test Probes |
|
BGP52L30-DE-SV
|
IC Test Probes |
|
IP54H-1INS
|
General Purpose Probes |
|
PIN54SG-1
|
General Purpose Probes |
|
HIA-MT54-G
|
Test System Interface Probes
|
|
BC54T65
|
Battery/Portable Application Probes
|
|
BC54T33
|
Battery/Portable Application Probes
|
|
BC57T30
|
Battery/Portable Application Probes
|
|
P3158
|
Loaded PCB Test Probes
May be suited to: General Purpose Applications |
|
P5160
|
Loaded PCB Test Probes
May be suited to: General Purpose Applications |
|
LT54
|
Loaded PCB Test Probes |
|
IP541
|
Loaded PCB Test Probes
May be suited to: Bare PCB Test Applications |
|
P2664
|
Bare PCB Test Probes
May be suited to: General Purpose Applications |
|
MT54
|
Bare PCB Test Probes |
|
MT554
|
Bare PCB Test Probes
|
| .125 (3.18) |
P2665
|
High Current Probes
May be suited to: General Purpose Applications |
|
BC92H-DE
|
Battery/Portable Application Probes
|
|
IP80
|
High Current Probes
May be suited to: General Purpose Applications |
|
HC80
|
High Current Probes
May be suited to: General Purpose Applications |
|
MT54
|
Bare PCB Test Probes |
| .156 (3.96) |
MT554
|
Bare PCB Test Probes |
|
MT54
|
Bare PCB Test Probes |
| .187 (4.75 |
IP125
|
High Current Probes
May be suited to: General Purpose Applications |
|
AW125L120-0
|
General Purpose Probes |
|
HC93
|
High Current Probes
May be suited to: General Purpose Applications |
|
MT554
|
Bare PCB Test Probes |
|
P2757
|
High Current Probes
May be suited to: General Purpose Applications |
|
IP93
|
High Current Probes
May be suited to: General Purpose Applications |
|
HC125
|
High Current Probes
May be suited to: General Purpose Applications |
