Home > Semiconductor Probes > Product Information
Filter
or
CSP1-1.27
Overall Length : 8.89mm (.350")
Download Information
PDF - CSP1-1.27 Datasheet.pdf
PDF - ECT-OB Semiconductor Brochure.pdf
IGES - CSP1-1.27BB Full.zip
Customize this product
Select Qty: (Min Qty 25) Spring Force (oz):
PRODUCT DETAIL
Test Center
1-1.27mm
Mechanical Specifications
Full Travel: 1.02mm (.040")
Working Travel: .89mm (.035")
Life Exceeds: 500K cycles
Test Heights: 8.0mm (.315")
Overall Length: 8.89mm (.350")
Operating Temperature
Operating Temperature: -55°C to +155°C
Electrical Specifications
Current Rating: 5 amps
Self Inductance: 3.1nH
Capacitance: .95pF
Bandwidth: 3.80GHz @ -1dB
Probe Resistance:
Average Probe Resistance: <100 mOhms
Material and Finishes:
Plungers: Heat treated beryllium copper, gold-plated over hard nickel
Barrel: Work-hardened phosphor bronze, gold plated over hard nickel
Spring: Steel alloy, gold plated over nickel
Spring Force: Preload - oz(g) Working Travel - oz(g)
Standard: 2.0 (57)