ECT POGO's Pomona, CA., - pogo pins,pogo contacts,pogo probes,spring probes,spring contacts, compliant contacts, compliant pins, pogo tower pins, pogo tower probes,contacts probes, test probes, IC test probes, battery contacts, battery probes,battery pogo, semiconductor probes,semiconductor contacts, burn-in contacts,interface probes, rf probes, high frequency probes, high current probes, test probes in lead free,lead free probe solution, lead free pogo solution, test probes in lead free process, spring probes in lead free, pogo pins for lead free test, spring contacts in lead free test, ATE probes, automotive probes, bare board test, bed of nails, bed of nails interfaces, board test probes, coaxial probes component test, contacts, contamination penetration, custom probes, custom spring probes, cyclo soldered, device test, dual level testing, dut ring, dut testing, finger contacts fixture, flux penetration, functional test, helix probes, high current probes, high performance probes, hot box test, hv test incircuit test, loaded board test, lowe contact resistance, MDA test, micro probes, mini-mite, no clean, PCB test probes, plungers, probing contacts, RF test probes, screw probes, solder mask, solid pins, small pad test, special probes, spring contacts, standard probes, surface mount devices, switch probes test centers, test clips, test connectors, test contacts, test fixtures, test interfaces, test jacks, test jigs, test pins, test points, test probes, tilt pins, unit under test, device under test, vaccum fixture test pins, vaccum fixtures, vcacuum jigs, IP20MEP30, IP27, HPA40, IP271, HPA-50, IP261, HPA-0, IP31, HPA-72, IP28, HPA-62, IP40, HPA-1, LT40, LTP-1, IP54, EPA-25, IP541, EPA-2, CSP, SCP, XP54, HCP-25 ST54, MT54, SPA-64, HPA-64, MT554, HPA-74, IP80, SPA-3, IP93, SPA-4, IP125, SPA-5, HC80, HCP-13, HC93, HCP-14, HC125, HCP-15, LT54, LTP-25, RP54, HEP-25, RT40,HTP-1, RT28, HTP-62, MEP20, SPA-0, SPA-1,HPA-52, SPA-25, PRP-74Z,SPA-2,HTP-62, HTP-1, HEP-25,XP54, LTP-25, LT54, BIP-1, BIP-2, BIP-3, BOARD MARKER PROBE, BMP-1, BMP-2, BTM, BANTAM PROBES, CCA, CP-059-013, DER, GPP-95-2, GSP-2B, K-50, MEPJ, P4301, POGO-1, POGO-25, POGO-72, POGO-62, RMP, SIP-90, SSP, PCB TEST PROBES, BARE BOARD TEST, WIRE HARNESS PROBES, TEST SYSTEM INTERFACE, HIGH CURRENT PROBES, HIGH FREQUENCY TEST PROBES, SEMICONDUCTOR TEST PROBES, SEMICONDUCTOR POGO PINS, BATTERY PROBES, PORTABLE CHARGER, PORTABLE PROBES, GENERAL PURPOSE PROBES, ECT, POGO PLUS, BIAS BALL PROBE, LONG TRAVEL PROBES, DOUBLE ENDED RECEPTACLES, SHORT TRAVEL PROBES, STANDARD PERFORMANCE PROBES, ANTI-WALKOUT PROBES, SWITCH PROBES, MOMENTARY SWITCH PROBES, ATE RECEIVER PROBE, AILGENT 3070 PROBES, RECEIVER PROBES, HP3070 PROBES, POGO-25HM, ATE INTERFACE PINS, TEST AND MEASUREMENT PROBES, HIGH FREQUENCY COAXIAL, DOUBLE ENDED POGOS, SINGLE ENDED POGOS, BATTERY INTERCONNECT PROBES, WIRE WRAP, FASTITE,POGO CONTACTS, ECT, pogo Battery Interconnect Probes ECT Contact Products Group' latest versatile line of battery probes gives you the design flexibility to match your performance, cost, and assembly requirements. Our design expertise and complete manufacturing capabilities will help bring your product to market faster and easier. Learn more. Semiconductor POGO® Contacts ECT Contact Products Group offers a wide array of new probes for semiconductor test. From our Double-Ended probes that come in pitches ranging from .4mm to 1.27 to our unique Mini-Mite™ Single-Ended probes that provide very low, consistent DC resistance, you can bet ECT will meet your semiconductor contact needs. Learn more. PogoPlus® Series Probes Conventional bias-type probes are susceptible to false opens - that is, transient electrical discontinuities that cause good products to during test. Revolutionary PogoPlus® probes eliminate probe-induced false opens, saving you the time, money and trouble of needless product retesting. The PogoPlus® is also designed to be the world's most durable probe with features like optional stainless-steel MicroSharp™ tips, a larger spring volume and enhanced pointing precision. The unrivaled electrical performance of the PogoPlus® is due to the interaction between the spring, captured ball and plunger, which forces the plunger into continuous contact with the barrel wall at all times. The result is uninterrupted electrical continuity and low overall resistance that can't be equaled by any other probe.

ZIP® High Performance - Z0 and Z1 Series

High Frequency, Low Inductance, High Current

ECT's Z0 SuperShort and Z1 series takes advantage of the ZIP® scalable architecture to arrive at an ultra-compact design tailor-made for low impedance and high frequency testing in high volume production environments without sacrificing life and travel.

Select a product for more info and specs:

Z0-050 | Z1-040 | Z1-050 | Z1-080

Z0 Series

SUPERSHORT, 1,91MM OAL

Z1 Series

3,43/3.30 MM OAL

Bandwidth

* Includes both DUT and board side travel

** Life specifications are based on lab results but are dependent on cleaning frequency and the specific customer application, including DUT materials, handler kit, maintenance, etc.

*** Contact resistance will increase over time due to solder build-up and wear Specifications subject to change without notification