Literature, - Battery Interconnect Probes ECT Contact Solutions' latest versatile line of battery probes gives you the design flexibility to match your performance, cost, and assembly requirements. Our design expertise and complete manufacturing capabilities will help bring your product to market faster and easier. Learn more. Semiconductor POGO® Contacts ECT Contact Solutions offers a wide array of new probes for semiconductor test. From our Double-Ended probes that come in pitches ranging from .4mm to 1.27 to our unique Mini-Mite™ Single-Ended probes that provide very low, consistent DC resistance, you can bet ECT will meet your semiconductor contact needs. Learn more. PogoPlus® Series Probes Conventional bias-type probes are susceptible to false opens - that is, transient electrical discontinuities that cause good products to during test. Revolutionary PogoPlus® probes eliminate probe-induced false opens, saving you the time, money and trouble of needless product retesting. The PogoPlus® is also designed to be the world's most durable probe with features like optional stainless-steel MicroSharp™ tips, a larger spring volume and enhanced pointing precision. The unrivaled electrical performance of the PogoPlus® is due to the interaction between the spring, captured ball and plunger, which forces the plunger into continuous contact with the barrel wall at all times. The result is uninterrupted electrical continuity and low overall resistance that can't be equaled by any other probe.
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